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39 Fuels and Applied Science Building The Fuels and Applied Science Building FASB is primarily a fuel fabrication facility but also has the characterization capability for unirradiated and irradiated materials. Fabrica- tion equipment in the facility is used for research and development of nuclear fuels on the laboratory-scale. The fuels are formed into various geometries for use in research experi- ments at various reactors throughout the world. In addition to fuel fabrication FASB is used for characterization of fabricated fuels and lightly irradiated structural materials. Characterization includes microscopy optical and electron thermal properties and me- chanical testing. FASB houses two hot cells used for irradiation assisted stress corrosion cracking studies of highly irradiated structural materials irradiated at the Advanced Test Reactor. The examination capabilities listed below are available to NSUF users. LEO 1455 scanning electron microscope Schottky field emission gun in-lens secondary electron detector below-the-lens second- ary electron detector. Magnifications range from 20X to 60000X probe current ranges from 1 pA to 1 mA accelerating voltages range from 200 V to 30 kV. Accommodates samples as large as 151515cm. Can accommodate long working distances for imaging at low magnifications 20X. Equipped with Oxford EDS and WDS. JEOL JSM-7600F scanning electron microscope Schottky field emission gun in-lens secondary electron detector below-the-lens second- ary electron detector. Low angle backscatter electron detector. Magnifications range from 25X to 1000000X accelerating voltages range from 0.1 to 30 kV probe currents range from 1 pA to 200 nA. Accommodates samples as large as 100 mm in diameter and 50 mm H or 200 mm in diameter and 20 mm H. Equipped with Oxford EDS WDS and EBSD. Zeiss D1M metallographic microscope Apochromatic correction for the beam path 6-place reflector turret for convenient change of reflector modules. Automatic component recognition bright-field dark-field polariza- tion DIC C-DIC and fluorescence in reflected light modes LED illumination.