Page 1
Page 2
Page 3
Page 4
Page 5
Page 6
Page 7
Page 8
Page 9
Page 10
Page 11
Page 12
Page 13
Page 14
Page 15
Page 16
Page 17
Page 18
Page 19
Page 20
Page 21
Page 22
Page 23
Page 24
Page 25
Page 26
Page 27
Page 28
Page 29
Page 30
Page 31
Page 32
Page 33
Page 34
Page 35
Page 36
Page 37
Page 38
Page 39
Page 40
Page 41
Page 42
Page 43
Page 44
Page 45
Page 46
Page 47
Page 48
Page 49
Page 50
Page 51
Page 52
Page 53
Page 54
Page 55
Page 56
33 Microscopy and Characterization Suite The Microscopy and Characterization Suite MaCS is a state-of-the-art materials char- acterization laboratory that provides crosscutting capabilities. The current rad operating envelope includes depleted uranium solid activated ceramics and fixed radiation sources. Depleted uranium may be in solid forms. Fixed radiation sources include activated metals solid nondispersible smearably clean i.e. considered to be free of removable radioactive contamination samples of activated metal and solid ceramic materials that are prepared to minimize sample mass are generally acceptable for analysis and testing in CAES. The examination capabilities listed below are available to NSUF users. JEOL JSM-6610LV scanning electron microscope High-resolution imaging with tungsten source Multielement solid-state BSE detector SE detector Accelerating voltages from 300 V to 30 kV Magnifications from 5x to 300000X Resolutions 3 nm at 30 kV and 8 nm at 3 kV Equipped with EDS EBSD and CL Speci- men tilt up to 90 degrees Maximum loadable specimen size is 300 mm in diameter and 80 mm in height Embedded color CCD camera for sample navigation. FEI QUANTA 3D FEG dual beam focused ion beam High-resolution field emission SEM column optimized for high brightness and high current High-current ion column with Ga liquid metal ion source Electron beam accel- erating voltages range from 200 V to 30 kV and continuous probe current up to 200 nA Ion beam accelerating voltages range from 2 kV to 30 kV Ion probe current ranges from 1.5 pA to 65 nA in 15 steps Ion beam resolution is 7 nm at 30 kV at beam coincident point Equipped with Everhart-Thornley SED Secondary electron secondary ion detector CDEM and STEM detector Specimen tilt angles range from -10 to 60 degrees Available gas injection systems are Pt and C Equipped with EDAX EDS and EBSD and Omniprobe micromanipulators Analytical working distance is 10 mm eucentric height Available specimen holders include single stub mount multi-stub holder pre-tilted mounts and universal lift-out holders to hold TEM grids and a single stub facilitating in-situ lift-outs.