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27 Irradiated Materials Characterization Laboratory The Irradiated Materials Characterization Laboratory IMCL located at INLs Materi- als and Fuels Complex was designed and built to house state-of-the-art nuclear fuels and materials characterization equipment in a shielded environment. The mission of the IMCL is to examine highly radioactive materials at the nanometer and atomic scale a scale not readily attainable on these types of materials with existing instrumentation. The examina- tion capabilities listed below are available to NSUF users. FEI QUANTA 3D FEG dual beam focused ion beam High-resolution field emission SEM column optimized for high brightness and high cur- rent High-current ion column with Ga liquid metal ion source Electron beam accelerat- ing voltages range from 200 V to 30 kV and continuous probe current up to 200 nA Ion beam accelerating voltages range from 2 kV to 30 kV Ion probe current ranges from 1.5 pA to 65 nA in 15 steps Ion beam resolution is 7 nm at 30 kV at beam coincident point Equipped with Everhart-Thornley SED Secondary electron and secondary ion detec- tor CDEM and retractable BSE detector Specimen tilt angles range from -10 to 60 degrees Available gas injection system is Pt Equipped with Omniprobe micromanipula- tors Analytical working distance is 10 mm eucentric height Available specimen holders include single stub mount multistub holder pretilted mounts universal lift-out holders to hold TEM grids and a single stub facilitating in-situ lift-outs custom met-mount holder custom met-mount holders which hold TEM grids and APTelectron tomography hold- ers Set up to work with a number of different samples ranging from irradiated metals and ceramics fresh nuclear fuels to irradiated fuels Equipped with IEE etching gases and has organic etch capabilities. FEI Titan Themis 200 scanning transmission electron microscope High brightness Schottky field emitter gun X-FEG Flexible high tension range can be adjusted to 80 120 and 200 kV Electron gun monochromator for high energy resolu- tion EELS and improved spatial resolution Specimen tilt ranges from -40 to 40 degrees for analytical double tilt holder and from -75 to 75 degrees for tomography holder Point resolution of 240 pm in TEM and 160 pm in STEM modes with energy spread of 0.8 eV at 200 kV without image or probe corrections Equipped with HAADF detector and on-axis triple DF1DF2BF detectors Equipped with super-X a high-sensitivity windowless EDX detector system based on SSD technology 0.7 srad solid angle and 120 mm2 combined