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28 EDS detector area Fast mapping with pixel dwell times down to 10 s Dedicated holders include FEI single tilt holders double tilt holders and tomography holders. Cameca SD100-R electron probe microanalyzer EPMA High-intensity tungsten source Accelerating voltages range from 5 to 50 kV Regulated beam current up to 250 nA Equipped with WDS capable of measuring elements from B to Cm Equipped with SE and BSE detectors Shielded EPMA capable of protecting elec- tronics and detectors from fields up to 1.11011 Bq 3 Ci of 137Cs Probe for EPMA software allows resolution of complex peak overlaps Quantitative spot and X-ray map measurements. The shielded EPMA capability to analyze transverse cross-section speci- mens will characterize the migration and redistribution of fuel constituents and fission products fission product radial profiles for burnup plutonium and other actinide agglom- eration and fuel-cladding chemical interaction. Elements to be analyzed may include U Pu Np Am Cm Zr Xe Cs Mo Tc Ru Rh Pd La Ce Pr Nd and others as requested by the PI. Left backscattered electron image of metal precipitates in an irradiated TRISO particle. Center and right interference-corrected quantita- tive X-ray maps of the region shown on the left.