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21 Electron Microscopy Laboratory Bright-field transmission electron micrographs acquired from mono- lithic U-10wtMo fuel irradi- ated in ATR to the average fission density of 5.251021 fisscm3 during RERTR-7 irradiation cam- paign a micrograph depicting long range ordering of the bubbles superlattice in U-10Mo fuel and b high resolution micrograph of bubble superlattice B. Miller J. Gan J. Madden J. F. Jue A. Rob- inson D. D. Keiser J. Nucl. Mater. 424 2012 38-42. FEI QUANTA 3D FEG dual beam focused ion beam High-resolution field emission SEM column optimized for high brightness and high current High-current ion column with Ga liquid metal ion source Electron beam accel- erating voltages range from 200 V to 30 kV and has continuous probe current up to 200 nA Ion beam accelerating voltages range from 2 kV to 30 kV Ion probe current ranges from 1.5 pA to 65 nA in 15 steps Ion beam resolution is 7 nm at 30 kV at beam coinci- dent point Equipped with Everhart-Thornley SED Secondary electron and secondary ion detector CDEM Specimen tilt angles range from -10 to 60 degrees Available gas injection systems are Pt and C Equipped with EDAX EDS WDS EBSD and Omniprobe micromanipulators Analytical working distance is 10 mm eucentric height Available specimen holders include single stub mount multi-stub holder pre-tilted mounts univer- sal lift-out holders to hold TEM grids and a single stub facilitating in-situ lift-outs custom met-mount holder custom met-mount holders which hold TEM grids and APTelectron tomography holders Set up to work with a number of different samples ranging from irradiated metals and ceramics fresh nuclear fuels transuranic-bearing Np Pu Am samples to irradiated fuels.