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29 Irradiated Materials Characterization Laboratory Left backscattered electron image of unirradiated MOX. Right quantitative analysis of metals at locations shown on the left. JEOL Neoscope JCM-5000 benchtop scanning electron microscope Small cartridge electron source Accelerating voltages can be adjusted to 5 10 and 15 kV Magnifications range from 10X to 40000X Equipped with secondary and backscattered electron detectors Maximum loadable specimen size is 70 mm in diameter and 50 mm in height Has low vacuum and high vacuum modes Specimen stage allows 35 mm travel in X and Y. Olympus BX 41 optical microscope UIS2 optical system Built-in Kohler illumination for transmitted light Magnifications ranging from 1.5X to 100X Ceramic-coated coaxial stage with rotating and torque mecha- nisms. Meiji EMZ-5 optical microscope Multi-coated optical components Available zoom ratio is 6.51 Magnifications range from 0.7X to 45X Field of view is 32mm-5.1mm Extended magnification range is 2.1X- 270X Rugged all metal body.