Shyam Dwaraknath

Profile Information
Name
Shyam Dwaraknath
Institution
University of Michigan
Publications:
"Multiple ion beam irradiation for the study of radiation damage in materials" Stephen Taller, David Woodley, Elizabeth Getto, Anthony Monterrosa, Zhijie Jiao, Ovidiu Toader, Fabian Naab, Thomas Kubley, Shyam Dwaraknath, Gary Was, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 412 2017 1-10 Link
The effects of transmutation produced helium and hydrogen must be included in ion irradiation experiments to emulate the microstructure of reactor irradiated materials. Descriptions of the criteria and systems necessary for multiple ion beam irradiation are presented and validated experimentally. A calculation methodology was developed to quantify the spatial distribution, implantation depth and amount of energy-degraded and implanted light ions when using a thin foil rotating energy degrader during multi-ion beam irradiation. A dual ion implantation using 1.34 MeV Fe+ ions and energy-degraded D+ ions was conducted on single crystal silicon to benchmark the dosimetry used for multi-ion beam irradiations. Secondary Ion Mass Spectroscopy (SIMS) analysis showed good agreement with calculations of the peak implantation depth and the total amount of iron and deuterium implanted. The results establish the capability to quantify the ion fluence from both heavy ion beams and energy-degraded light ion beams for the purpose of using multi-ion beam irradiations to emulate reactor irradiated microstructures.