Robert Okojie
Profile Information
- Name
- Dr. Robert Okojie
- Institution
- NASA Glenn Research Center
- Position
- Research Electronics Engineer
- Affiliation
- IEEE
- h-Index
- ORCID
- 0000-0002-5496-8725
- Biography
- <p style="text-align: justify"><span style="font-size: 12pt; font-family: "Calibri", sans-serif">Dr. Robert Okojie develops extreme environment silicon carbide (SiC) MicroElectroMechanical Systems (MEMS), and had demonstrated SiC pressure sensor operational at 800 </span><span style="font-size: 12pt; font-family: "Cambria Math", serif">℃</span><span style="font-size: 12pt; font-family: "Calibri", sans-serif">, with broad applications across several NASA and other government programs. His current work is the on-chip integration of pressure and temperature sensors to reduce form factor while increasing density of multi functioning sensors. He currently holds over 20 patents relating to high temperature sensors and actuators and a 2020 inductee of the NASA Inventors Hall of Fame. He is a Senior Member of the IEEE and member of the Scientific Research Society (Sigma Xi). </span></p><p> <br></p>
- Expertise
- Corrosion Sensors, Electronics, Flow Sensors, MEMS, Pressure Sensors, Temperature Sensor, Wide Band Gap
Accomplishments
NSUF Supported Research
In-Operando Performance Characterization of On-Chip Integrated SiC Pressure/Temperature Sensors under Irradiation - FY 2024 Super RTE Call, #24-5077
Reliability Assessment of Irradiated Integrated Silicon Carbide Pressure/Temperature Sensors for Lunar Fission Surface Power Reactor - FY 2024 RTE 1st Call, #24-4798