Robert Okojie
- Name
- Dr. Robert Okojie
- Institution
- NASA Glenn Research Center
- Position
- Research Electronics Engineer
- Affiliation
- IEEE
- h-Index
- ORCID
- 0000-0002-5496-8725
- Biography
Dr. Robert Okojie develops extreme environment silicon carbide (SiC) MicroElectroMechanical Systems (MEMS), and had demonstrated SiC pressure sensor operational at 800 ℃, with broad applications across several NASA and other government programs. His current work is the on-chip integration of pressure and temperature sensors to reduce form factor while increasing density of multi functioning sensors. He currently holds over 20 patents relating to high temperature sensors and actuators and a 2020 inductee of the NASA Inventors Hall of Fame. He is a Senior Member of the IEEE and member of the Scientific Research Society (Sigma Xi).
- Expertise
- Corrosion Sensors, Electronics, Flow Sensors, MEMS, Pressure Sensors, Temperature Sensor, Wide Band Gap
In-Operando Performance Characterization of On-Chip Integrated SiC Pressure/Temperature Sensors under Irradiation - FY 2024 Super RTE Call, #24-5077
Reliability Assessment of Irradiated Integrated Silicon Carbide Pressure/Temperature Sensors for Lunar Fission Surface Power Reactor - FY 2024 RTE 1st Call, #24-4798
About Us
The Nuclear Science User Facilities (NSUF) is the U.S. Department of Energy Office of Nuclear Energy's only designated nuclear energy user facility. Through peer-reviewed proposal processes, the NSUF provides researchers access to neutron, ion, and gamma irradiations, post-irradiation examination and beamline capabilities at Idaho National Laboratory and a diverse mix of university, national laboratory and industry partner institutions.
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