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34 FEI Technai TF-30-FEG STwin scanning transmission electron microscope Schottky field emitter with high maximum beam current 100 nA Flexible high ten- sion ranging from 50 100 to 300 kV and values in between High probe currents of 0.6 nA in 1 nm spot and 15 nA in a 10 nm spot Small energy spread of 0.8 eV TEM point resolution of 0.2 nm TEM line resolution of 0.102 nm Magnification ranging from 60X to 1000000X Camera length ranging from 80 to 4500 mm STEM HAADF resolution of 0.19 nm Specimen tilt ranging from -40 to 40 degrees for a double tilt holder and -80 to 80 degrees for a tomography holder EDS solid angle of 0.13 srad High resolution STEM with HAADF detector Embedding of EDX PEELS and energy filter spectrum imaging with multiple detectors Simultaneous data recording by STEM CCD camera EDX detec- tors EELS spectrometers and energy filters. High-resolution transmission electron micrographs of a CeO2 irradiated with 150 keV Kr at 600C to 11016cm2 a with the electron beam parallel to the 110 zone axis and b corresponding under-focused condition. White arrows indicate location of selected bubbles L. He C. Yablinsky M. Gupta J. Gan M. A. Kirk T. R. Allen Nucl. Tech. 182 2013 164.